Sheng Fei, Executive Vice President of CITS, Visits NJCIT for Research and Guidance

On November 1, a delegation led by Sheng Fei, Executive Vice President of the China Inspection and Testing Society (CITS), along with Xu Jun, Director of the Department of Science Popularization and Integrated Media of CITS, and Shi Wei, Deputy Director of the Nanjing Branch of the China Quality Certification Centre, visited Nanjing Vocational College of Information Technology (NJCIT) for research. Wang Danzhong, Vice Chairman of the Special Committee of Inspection and Testing of the National Steering Committee for Vocational Education and Teaching in Market Regulation and Secretary of the CPC Committee at NJCIT, warmly received Executive Vice President Sheng and his delegation.

Accompanied by Ma Yongbing, Dean of the School of Electronic Information, Executive Vice President Sheng and his delegation conducted on-site research on the operation of CQCTT (CQC-Trusted Testing Technology Co., Ltd.), a mixed-ownership industry-education integration platform.

At the research symposium, Ma Yongbing, Dean of the School of Electronic Information, delivered a report entitled Carrying Forward NRIC's Culture and Building a Training Center for High-level Talent in Electronics. During the exchange, Executive Vice President Sheng emphasized the need to develop a closed-loop system in which government, enterprises, colleges, research institutions, users, and testing organizations collaborate to provide vocational education and training for talent majoring in quality management and certification and electronic product testing technology. He detailed the processes of selection, determination, validation, and review, which are essential to defining inspection and testing technology, and discussed strategies for establishing a comprehensive talent training system and framework. Executive Vice President Sheng believes that testing is fundamental to all forms of conformity assessment and instrument and equipment testing is merely a method, not inspection and testing technology.

The exchange reflects that since his transition from Deputy Director of the National Certification and Accreditation Administration to Executive Vice President of CITS, Mr. Sheng Fei has shown deep concern, guidance, and support for the development of NJCIT. Additionally, he has provided valuable guidance for the follow-up development of the New Double High-Level strategy (high-level school-running capabilities, and high-quality industry-education integration) by the School of Electronic Information.
Secretary of the General CPC Branch Chen Yongquan, Dean Ma Yongbing, Vice Dean Yuan Nannan, and Vice Dean Zhang Hannian from the School of Electronic Information attended the research symposium.

Photo/Text by Liu Fan, School of Electronic Information

Reviewed by Chen Yongquan and Ma Yongbing, School of Electronic Information